Electrically reversible cracks in an intermetallic film controlled by an electric field
Zengqian Liu, Junfeng Liu, Michael D. Biegalski, Jia‐Mian Hu, Shun‐Li Shang, Yanzhou Ji, J. M. Wang, Shang‐Lin Hsu, Anthony T. Wong, Megan J. Cordill, Bernd Gludovatz, Cassie Marker, Han Yan, Z. X. Feng, Long You, Ming Lin, Thomas Z. Ward, Zi‐Kui Liu, Chengbao Jiang, Long‐Qing Chen, Robert O. Ritchie, Hans M. Christen, R. Ramesh (2017). Electrically reversible cracks in an intermetallic film controlled by an electric field. Nature Communications, 9(1), DOI: 10.1038/s41467-017-02454-8.
