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Operando odd random phase electrochemical impedance spectroscopy for in situ monitoring of the anodizing process
Meisam Dabiri Havigh, Benny Wouters, Noël Hallemans, Raf Claessens, John Lataire, Herman Terryn, Annick Hubin (2022). Operando odd random phase electrochemical impedance spectroscopy for in situ monitoring of the anodizing process. Electrochemistry Communications, 137, pp. 107268-107268, DOI: 10.1016/j.elecom.2022.107268.
Article125 days agoMonitoring initial contact of UV-cured organic coatings with aqueous solutions using odd random phase multisine electrochemical impedance spectroscopy
Benny Wouters, Ehsan Jalilian, Raf Claessens, Negin Madelat, Tom Hauffman, Guy Van Assche, Herman Terryn, Annick Hubin (2021). Monitoring initial contact of UV-cured organic coatings with aqueous solutions using odd random phase multisine electrochemical impedance spectroscopy. Corrosion Science, 190, pp. 109713-109713, DOI: 10.1016/j.corsci.2021.109713.
Article125 days agoOn the use of instantaneous impedance for post-electrochemical treatment analysis
Benny Wouters, Raf Claessens, Annick Hubin, Herman Terryn (2018). On the use of instantaneous impedance for post-electrochemical treatment analysis. Electrochemistry Communications, 93, pp. 187-190, DOI: 10.1016/j.elecom.2018.07.014.
Article125 days agoIn Situ Monitoring of the Lateral Water Diffusion in Coated Metals Using Dual Odd Random Phase Eis
Negin Madelat, Benny Wouters, Raf Claessens, Zahra Jiryaei, Annick Hubin, Herman Terryn, Tom Hauffman (2023). In Situ Monitoring of the Lateral Water Diffusion in Coated Metals Using Dual Odd Random Phase Eis. , DOI: 10.2139/ssrn.4517047.
Preprint125 days agoIn situ monitoring of the lateral water diffusion in coated metals using dual odd random phase EIS
Negin Madelat, Benny Wouters, Raf Claessens, Zahra Jiryaeisharahi, Annick Hubin, Herman Terryn, Tom Hauffman (2023). In situ monitoring of the lateral water diffusion in coated metals using dual odd random phase EIS. Electrochemistry Communications, 155, pp. 107577-107577, DOI: 10.1016/j.elecom.2023.107577.
Article125 days ago