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  5. Piezocatalysis for Chemical–Mechanical Polishing of SiC: Dual Roles of t‐BaTiO<sub>3</sub> as a Piezocatalyst and an Abrasive

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Article
en
2023

Piezocatalysis for Chemical–Mechanical Polishing of SiC: Dual Roles of t‐BaTiO<sub>3</sub> as a Piezocatalyst and an Abrasive

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en
2023
Vol 20 (21)
Vol. 20
DOI: 10.1002/smll.202310117

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Zhong Lin Wang
Zhong Lin Wang

Beijing Institute of Technology

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Tao Hu
Jinxi Feng
Wen Yan
+10 more

Abstract

Chemical mechanical polishing (CMP) offers a promising pathway to smooth third-generation semiconductors. However, it is still a challenge to reduce the use of additional oxidants or/and energy in current CMP processes. Here, a new and green atomically smoothing method: Piezocatalytic-CMP (Piezo-CMP) is reported. Investigation shows that the Piezo-CMP based on tetragonal BaTiO

How to cite this publication

Tao Hu, Jinxi Feng, Wen Yan, Shuanghong Tian, Jingxiang Sun, Xiaosheng Liu, Di Wei, Ziming Wang, Yang Yu, Jason Chun‐Ho Lam, Shaorong Liu, Zhong Lin Wang, Ya Xiong (2023). Piezocatalysis for Chemical–Mechanical Polishing of SiC: Dual Roles of t‐BaTiO<sub>3</sub> as a Piezocatalyst and an Abrasive. , 20(21), DOI: https://doi.org/10.1002/smll.202310117.

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Publication Details

Type

Article

Year

2023

Authors

13

Datasets

0

Total Files

0

Language

en

DOI

https://doi.org/10.1002/smll.202310117

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