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  5. Thermal and Thermoelectric Measurements of Low Dimensional Nanostructures

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Article
en
2003

Thermal and Thermoelectric Measurements of Low Dimensional Nanostructures

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en
2003
DOI: 10.1115/ht2003-47263

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Zhong Lin Wang
Zhong Lin Wang

Beijing Institute of Technology

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Choongho Yu
Wanyoung Jang
Tobias Hanrath
+7 more

Abstract

Low dimensional materials have unique thermal and thermoelectric properties that can be very different from their bulk counterparts. In a previous work, we and our collaborators have developed a microdevice for measuring thermal and thermoelectric properties of multiwall carbon nanotubes. Here, we used an improved design of the device for measuring single wall carbon nanotubes, Ge nanowires, and SnO2 nanobelts. These nanostructures are trapped between two adjacent symmetric silicon nitride membranes of the micro device using either a wet deposition method or in-situ chemical vapor deposition. The measurements provide the critically needed data of the unique thermophysical properties of these nanomaterials.

How to cite this publication

Choongho Yu, Wanyoung Jang, Tobias Hanrath, Dohyung Kim, Zhen Yao, Brian A. Korgel, Li Shi, Zhong Lin Wang, Deyu Li, Arun Majumdar (2003). Thermal and Thermoelectric Measurements of Low Dimensional Nanostructures. , DOI: https://doi.org/10.1115/ht2003-47263.

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Publication Details

Type

Article

Year

2003

Authors

10

Datasets

0

Total Files

0

Language

en

DOI

https://doi.org/10.1115/ht2003-47263

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