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Get Free AccessAt the Advanced Light Source (ALS), Beamline 8.3.2 performs hard X-ray micro-tomography under conditions of high temperature, pressure, mechanical loading, and other realistic conditions using environmental test cells. With scan times of 10s–100s of seconds, the microstructural evolution of materials can be directly observed over multiple time steps spanning prescribed changes in the sample environment. This capability enables in-situ quasi-static mechanical testing of materials. We present an overview of our in-situ mechanical testing capabilities and recent hardware developments that enable flexural testing at high temperature and in combination with acoustic emission analysis.
Harold Barnard, Alastair A. MacDowell, Dilworth Y. Parkinson, Pratiti Mandal, Michael W. Czabaj, Yan Gao, Emmanuel Maillet, Basil Blank, Natalie Larson, Robert O. Ritchie, Bernd Gludovatz, Claire Acevedo, Dong Liu (2017). Synchrotron X-ray micro-tomography at the Advanced Light Source: Developments in high-temperature in-situ mechanical testing. Journal of Physics Conference Series, 849, pp. 012043-012043, DOI: 10.1088/1742-6596/849/1/012043.
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Type
Article
Year
2017
Authors
13
Datasets
0
Total Files
0
Language
English
Journal
Journal of Physics Conference Series
DOI
10.1088/1742-6596/849/1/012043
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