0 Datasets
0 Files
Get instant academic access to this publication’s datasets.
Yes. After verification, you can browse and download datasets at no cost. Some premium assets may require author approval.
Files are stored on encrypted storage. Access is restricted to verified users and all downloads are logged.
Yes, message the author after sign-up to request supplementary files or replication code.
Join 50,000+ researchers worldwide. Get instant access to peer-reviewed datasets, advanced analytics, and global collaboration tools.
✓ Immediate verification • ✓ Free institutional access • ✓ Global collaborationJoin our academic network to download verified datasets and collaborate with researchers worldwide.
Get Free AccessSummaryThe composition of chromium free conversion layers on aluminium, based on zirconium has been determined using complementary surface analytical techniques: SEM, AES, XPS, SIMS. The zirconium based chromium free conversion layer consists of a two layered structure, with total thickness less than 10 nm, in which the bottom layer contains only Al and O, while the top layer contains also a fluorinated zirconium compound and probably a polymer that is concentrated towards the outer surface. In a second part the influence of the conversion time on the thickness of the film was studied using AES, SE and EIS. It is concluded that the zirconium based conversion layers are formed within ten seconds and a successive increase in conversion time results only in a very slight thickening of the layer.
T. Schram, G. Goeminne, Herman Terryn, W. Vanhoolst, P. Van Espen (1995). Study of the Composition of Zirconium based Chromium free Conversion Layers on Aluminium. Transactions of the IMF, 73(3), pp. 91-95, DOI: 10.1080/00202967.1995.11871066.
Datasets shared by verified academics with rich metadata and previews.
Authors choose access levels; downloads are logged for transparency.
Students and faculty get instant access after verification.
Type
Article
Year
1995
Authors
5
Datasets
0
Total Files
0
Language
English
Journal
Transactions of the IMF
DOI
10.1080/00202967.1995.11871066
Access datasets from 50,000+ researchers worldwide with institutional verification.
Get Free Access
