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Get Free AccessThe pull-in instability is the inherent property of a micro-electromechanical system (MEMS) when the voltage is larger than its threshold value. Recently, a fractal MEMS system was proposed to overcome the pull-in instability with great success, and it has opened a total new path for the so-called pull-in stability. This paper suggests a pull-in plateau, a novel concept for qualifying the pull-in stability. The plateau’s basic properties are elucidated, and the effect of the fractal dimensions on the plateau width is elucidated, and the paper concludes that there exists a critical condition for an ever pull-in stability when both the acceleration and the speed of the system equal zero.
Ji-huan He, Qian Yang, Chun‐Hui He, Haibin Li, Eerdun Buhe (2022). PULL-IN STABILITY OF A FRACTAL MEMS SYSTEM AND ITS PULL-IN PLATEAU. Fractals, 30(09), DOI: 10.1142/s0218348x22501857.
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Type
Article
Year
2022
Authors
5
Datasets
0
Total Files
0
Language
English
Journal
Fractals
DOI
10.1142/s0218348x22501857
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