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  5. Growth and doping control of Ge/Si and Si/Ge core-shell nanowires

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Article
en
2016

Growth and doping control of Ge/Si and Si/Ge core-shell nanowires

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en
2016
DOI: 10.1109/iciprm.2016.7528645

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Zhong Lin Wang
Zhong Lin Wang

Beijing Institute of Technology

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Kotaro Nishibe
Wipakorn Jevasuwan
Masanori Mitome
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Abstract

Selective doping and band-offset in core-shell nanowire (NW) structures using germanium (Ge)/ silicon (Si) can realize a type of high electron mobility transistor (HEMT) structure in one-dimensional NWs by separating the carrier transport region from the impurity-doped region. Precise analysis, using Raman spectroscopy of the Ge optical phonon peak, can distinguish three effects: the phonon confinement effect, the stress effect due to the heterostructures, and the Fano effect. Using these techniques, we obtained conclusive evidence of hole gas accumulation in Ge/Si core-shell NWs. The control of hole gas concentration can be realized by changing the B doping concentration in the Si shell.

How to cite this publication

Kotaro Nishibe, Wipakorn Jevasuwan, Masanori Mitome, Yoshio Bando, Zhong Lin Wang, Naoki Fukata (2016). Growth and doping control of Ge/Si and Si/Ge core-shell nanowires. , DOI: https://doi.org/10.1109/iciprm.2016.7528645.

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Publication Details

Type

Article

Year

2016

Authors

6

Datasets

0

Total Files

0

Language

en

DOI

https://doi.org/10.1109/iciprm.2016.7528645

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