0 Datasets
0 Files
Get instant academic access to this publication’s datasets.
Join our academic network to download verified datasets and collaborate with researchers worldwide.
Get Free AccessA flexible dual-channel curvilinear electromagnetic filter has been designed and constructed to fabricate multilayered composite films in vacuum arc ion plating. The filter possesses two guiding channels and one mixing unit. Multilayered TiN/AlN and TiAlN composite films can be produced by controlling the frequency or interval of the two cathodes. The x-ray photoelectron spectroscopy and low-angle x-ray diffraction results reveal the periodic Ti and Al structures in the TiN/AlN films. The TiAlN films exhibit a smooth surface morphology confirming effective filtering of macroparticles by the filter. High temperature oxidation conducted at 700 degrees C for an hour indicates that the weight increment in the TiAlN films produced by the dual filter is only half of that of the TiAlN films produced without a filter, thereby showing better resistance against surface oxidation.
Hua Dai, Yao Shen, Jing Wang, Ming Xu, Liuhe Li, Xiaoling Li, Xun Cai, Paul Kim Ho Chu (2008). Fabrication for multilayered composite thin films by dual-channel vacuum arc deposition. , 79(6), DOI: https://doi.org/10.1063/1.2937195.
Datasets shared by verified academics with rich metadata and previews.
Authors choose access levels; downloads are logged for transparency.
Students and faculty get instant access after verification.
Type
Article
Year
2008
Authors
8
Datasets
0
Total Files
0
Language
en
DOI
https://doi.org/10.1063/1.2937195
Access datasets from 50,000+ researchers worldwide with institutional verification.
Get Free AccessYes. After verification, you can browse and download datasets at no cost. Some premium assets may require author approval.
Files are stored on encrypted storage. Access is restricted to verified users and all downloads are logged.
Yes, message the author after sign-up to request supplementary files or replication code.
Join 50,000+ researchers worldwide. Get instant access to peer-reviewed datasets, advanced analytics, and global collaboration tools.
✓ Immediate verification • ✓ Free institutional access • ✓ Global collaboration