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  5. Deep-learning enabled single-shot 3D feature detection in fringe projection profilometry

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Article
English
2023

Deep-learning enabled single-shot 3D feature detection in fringe projection profilometry

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0 Files

English
2023
DOI: 10.1117/12.2663955

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Alberto Patino Vanegas
Alberto Patino Vanegas

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Juan C. Peña
Eberto Benjumea
Raúl Vargas
+3 more

Abstract

Reliably detecting or tracking 3D features is challenging. It often requires preprocessing and filtering stages, along with fine-tuned heuristics for reliable detection. Alternatively, artificial intelligence-based strategies have recently been proposed; however, these typically require many manually labeled images for training. We introduce a method for 3D feature detection by using a convolutional neural network and a single 3D image obtained by fringe projection profilometry. We cast the problem of 3D feature detection as an unsupervised detection problem. Hence, the goal is to use a neural network that learns to detect specific features in 3D images using a single unlabeled image. Therefore, we implemented a deep-learning method that exploits inherent symmetries to detect objects with few training data and without ground truth. Subsequently, using a pyramid methodology of rescaling each image to be processed, we achieved feature detections of different sizes. Finally, we unified the detections using a non-maximum suppression algorithm. Preliminary results show that the method provides reliable detection under different scenarios with a more flexible training procedure than other competing methods.

How to cite this publication

Juan C. Peña, Eberto Benjumea, Raúl Vargas, Lenny A. Romero, Alberto Patino Vanegas, Andrés G. Marrugo (2023). Deep-learning enabled single-shot 3D feature detection in fringe projection profilometry. , pp. 4-4, DOI: 10.1117/12.2663955.

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Publication Details

Type

Article

Year

2023

Authors

6

Datasets

0

Total Files

0

Language

English

DOI

10.1117/12.2663955

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