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Get Free AccessHere, in this presentation, we demonstrate the operation and applications of a custom-built automation program to acquire high-resolution data on an aberration-corrected STEM.
Alexander J. Pattison, Cássio Cardoso Santos Pedroso, Bruce E. Cohen, Justin C. Ondry, Paul Alivisatos, Wolfgang Theis, Peter Ercius (2024). Automated High-Resolution Phase-Contrast Scanning Transmission Electron Microscopy. , 30(Supplement_1), DOI: https://doi.org/10.1093/mam/ozae044.192.
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Type
Article
Year
2024
Authors
7
Datasets
0
Total Files
0
Language
en
DOI
https://doi.org/10.1093/mam/ozae044.192
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