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Hu Chen, Vincent Maurice, Lorena H. Klein, Linsey Lapeire, Kim Verbeken, Herman Terryn, Philippe Marcus (2015). Grain boundary passivation studied by in situ scanning tunneling microscopy on microcrystalline copper. Journal of Solid State Electrochemistry, 19(12), pp. 3501-3509, DOI: 10.1007/s10008-015-2787-x.
