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Dong Liu, Stephen Fabes, Bo-Shiuan Li, Daniel Francis, Robert O. Ritchie, Martin Kuball (2019). Characterization of the Interfacial Toughness in a Novel “GaN-on-Diamond” Material for High-Power RF Devices. ACS Applied Electronic Materials, 1(3), pp. 354-369, DOI: 10.1021/acsaelm.8b00091.
