W.G. Sloof

Acid−Base Characterization of Aluminum Oxide Surfaces with XPS

J. van den Brand, Paul C. Snijders, W.G. Sloof, Herman Terryn, J.H.W. de Wit (2004). Acid−Base Characterization of Aluminum Oxide Surfaces with XPS. The Journal of Physical Chemistry B, 108(19), pp. 6017-6024, DOI: 10.1021/jp037877f.