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Alexandre Zimmer, Nicolas Stein, L. Johann, Sake Van Gils, Herman Terryn, Erik Stijns, C. Boulanger (2005). Infrared and Visible Dielectric Function of Electroplated Bi[sub 2±x]Te[sub 3±x] Films Determined by Spectroscopic Ellipsometry. Journal of The Electrochemical Society, 152(10), pp. G772-G772, DOI: 10.1149/1.2012587.
