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Jan Piot, Jun Qian, Hugo Pirée, Gerard Kotte, J. Pétry, Jean-pierre Kruth, Paul Vanherck, Chris Van Haesendonck, Dominiek Reynaerts (2012). Design of a sample approach mechanism for a metrological atomic force microscope. Measurement, 46(1), pp. 739-746, DOI: 10.1016/j.measurement.2012.09.012.
