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  5. Ridge-twin boundaries as prolific dislocation sources in low stacking-fault energy metals and alloys

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Preprint
English
2023

Ridge-twin boundaries as prolific dislocation sources in low stacking-fault energy metals and alloys

0 Datasets

0 Files

English
2023
Research Square (Research Square)
DOI: 10.21203/rs.3.rs-2922985/v1

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Robert O. Ritchie
Robert O. Ritchie

University of California, Berkeley

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Xiaoqian Fu
Jun Ding
C. Ozsoy-Keskinbora
+8 more

Abstract

Dislocation activities are crucial in facilitating plastic deformation, even in metals that are prone to deformation twinning. We have discovered a novel type of prolific dislocation sources, which reside on nano-sized ridges along the borders between different twin variants in low stacking-fault energy (SFE) materials. These sources act as dislocation generators that promote dislocation interaction and accumulation, spreading plastic strain and leading to robust strain hardening at the early stages of plastic deformation. Molecular dynamic simulations indicate that the formation of nano-sized ridge-twin structures is energetically favorable at the junctions between multiple twins, explaining why such structures are ubiquitous in low-SFE materials. Decreasing the SFE can significantly increase the population of ridge-twin boundaries, facilitating strain hardening to sustain the stability of plastic flow. These findings provide new insights into the origin of dislocation plasticity and the high early-stage strain hardening rate in low-SFE materials.

How to cite this publication

Xiaoqian Fu, Jun Ding, C. Ozsoy-Keskinbora, Guang Yang, Yujie Chen, Yan Fang, Eun Soo Park, Ze Zhang, Robert O. Ritchie, E. Ma, Qian Yu (2023). Ridge-twin boundaries as prolific dislocation sources in low stacking-fault energy metals and alloys. Research Square (Research Square), DOI: 10.21203/rs.3.rs-2922985/v1.

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Publication Details

Type

Preprint

Year

2023

Authors

11

Datasets

0

Total Files

0

Language

English

Journal

Research Square (Research Square)

DOI

10.21203/rs.3.rs-2922985/v1

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