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  5. CHEMICAL FORCE MICROSCOPY

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Article
English
1997

CHEMICAL FORCE MICROSCOPY

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0 Files

English
1997
Annual Review of Materials Science
Vol 27 (1)
DOI: 10.1146/annurev.matsci.27.1.381

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Charles M. Lieber
Charles M. Lieber

Harvard University

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Aleksandr Noy
Dmitri Vezenov
Charles M. Lieber

Abstract

▪ Abstract Atomic force microscopy is an imaging tool used widely in fundamental research, although it has, like other scanned probe microscopies, provided only limited information about the chemical nature of systems studied. Modification of force microscope probe tips by covalent linking of organic monolayers that terminate in well-defined functional groups enables direct probing of molecular interactions and imaging with chemical sensitivity. This new chemical force microscopy technique has been used to probe adhesion and frictional forces between distinct chemical groups in organic and aqueous solvents. Contact mechanics provide a framework to model the adhesive forces and to estimate the number of interacting molecular groups. In general, measured adhesive and frictional forces follow trends expected from the strengths of the molecular interactions, although solvation also plays an important role. Knowledge of these forces provides a basis for rationally interpretable mapping of a variety of chemical functionalities and processes such as protonation and ionization.

How to cite this publication

Aleksandr Noy, Dmitri Vezenov, Charles M. Lieber (1997). CHEMICAL FORCE MICROSCOPY. Annual Review of Materials Science, 27(1), pp. 381-421, DOI: 10.1146/annurev.matsci.27.1.381.

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Publication Details

Type

Article

Year

1997

Authors

3

Datasets

0

Total Files

0

Language

English

Journal

Annual Review of Materials Science

DOI

10.1146/annurev.matsci.27.1.381

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